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Jxxxx drain gate source modelname [area] [OFF] [IC=vds,vgs] |
+ [TEMP=local_temp] [M=mult] [DTEMP=dtemp] |
drain | Drain node |
gate | Gate node |
source | Source node |
modelname | Name of model defined in a .model statement. Must begin with a letter but can contain any character except whitespace and period '.'. |
area | Area multiplying factor. Area scales up the device. E.g. an area of 3 would make the device behave like 3 transistors in parallel. Default is 1. |
OFF | Instructs simulator to calculate operating point analysis with device initially off. This is used in latching circuits such as thyristors and bistables to induce a particular state. See .OP for more details. |
vds,vgs | Initial conditions for drain-source and gate-source junctions respectively. These only have an effect if the UIC parameter is specified on the .TRAN statement. |
local_temp | Local temperature. Overrides specification in .OPTIONS or .TEMP statements. |
mult | Device multiplier. Equivalent to putting mult devices in parallel. |
dtemp | Differential temperature. Similar to local_temp but is specified relative to circuit temperature. If both TEMP and DTEMP are specified, TEMP takes precedence. |
.model modelname NJF ( parameters ) |
.model modelname PJF ( parameters ) |
The symbols '$\times$' and '$\div$' in the Area column means that parameter should be multiplied or divided by the area factor respectively.
Name | Description | Units | Default | Area |
---|---|---|---|---|
VTO | Threshold voltage | V | -2.0 | |
VTOTC | VTO temp coefficient | V/$°$C | 0 | |
BETA | Transconductance parameter | A/V2 | 1e-4 | $\times$ |
BETATCE | BETA temperature coefficient | % | 0 | |
LAMDA | Channel length modulation parameter | 1/V | 0 | |
ALPHA | Impact ionisation coefficient | 0 | ||
VK | Impact ionisation knee voltage | V | 0 | |
RS | Source ohmic resistance | $\Omega$ | 0 | $\div$ |
CGS | Zero-bias G-S junction capacitance | F | 0 | $\div$ |
CGD | Zero-bias G-D junction capacitance | F | 0 | $\div$ |
M | Grading coefficient | 1.0 | ||
PB | Gate junction potential | V | 1 | |
IS | Gate junction saturation current | A | 1e-14 | $\times$ |
N | Gate junction emission coefficient | 1 | ||
ISR | Recombination current | 0 | ||
NR | ISR emission coefficient | |||
XTI | IS temperature coefficient | 3 | ||
KF | Flicker noise coefficient | 0 | ||
AF | Flicker noise exponent | 1 | ||
FC | Coefficient for forward bias depletion capacitance | 0.5 | ||
NLEV | Select noise model | 2 | ||
GDSNOI | Channel noise coefficient. Use with NLEV=3 | 1.0 | ||
TNOM, T_MEASURED | Reference temperature; the temperature at which the model parameters were measured | $°$C | 27 | |
T_ABS | If specified, defines the absolute model temperature overriding the global temperature defined using .TEMP | $°$C | - | |
T_REL_GLOBAL | Offsets global temperature defined using .TEMP. Overridden by T_ABS | $°$C | 0.0 | |
Q2 is a U430 with a local temperature of 100$°$C.
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